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Updated: Aug 4, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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使用光子晶体腔的超敏感纳米级光机电表

Ji Xia1, Qifeng Qiao1, Haoyang Sun1

  • 1Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117575, Singapore.

Nanophotonics (Berlin, Germany)
|December 5, 2024
PubMed
概括

这项研究引入了一种光机电表,用于高度敏感的电荷检测. 该设备采用纳米光子系统,以实现前所未有的精度,用于各种应用中检测带电纳米粒子.

关键词:
腔内光学机械学 腔内光学机械学电表电量计的电量计是什么静电弹软化软化 静电弹软化软化光子晶体纳米束共振器的共振器

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相关概念视频

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.