相关实验视频

Updated: Jun 5, 2025

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Published on: August 26, 2015

固态电池快充的起源由冷传输X射线显微镜揭示

Jiaxuan Liu^1,2,3, Yajie Song^1,2,4, Qingsong Liu^1,2,3,4

¹School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, China.

Proceedings of the National Academy of Sciences of the United States of America

|December 9, 2024

概括

接口问题限制了固态电池 (SSB) 的快速充电. 使用操作式冷传输X射线显微镜 (Cryo-TXM),研究人员可视化了非法拉第电场,在10°C时使容量增加了400%.

科学领域:

材料科学材料科学材料科学
电化学电化学电化学
电池技术电池技术

背景情况:

固态电池 (SSB) 与传统电池相比,具有潜在的优势,但在快速充电方面面临挑战.
在电极-电解质接口上的高阻抗非法拉第电场是SSB快速充电的关键限制.
动态非法拉第电场如何降低快充性能的精确机制由于缺乏合适的检测技术,因此尚不清楚.

研究的目的:

调查SSB快速充电过程中非法拉第电场的产生和消除机制.
阐明动态非法拉第电场在引起高极化和容量降低中的作用.
开发和应用一种新的技术,以在粒子尺度上可视化这些现象.

主要方法:

开发和运行冷传输X射线显微镜 (Cryo-TXM) 的应用,用于非破坏性的粒子尺度成像.
在快速充电期间,追踪离子在LiNi0.8Co0.1Mn0.1O2 (NCM811) 阴极内的自我平衡路径.
在快速充电期间间歇地应用反向电位,以减轻非法拉第电场恶化.

主要成果:

Cryo-TXM成功地可视化了在阴极接口上的非法拉代电场的动态演变.
晚期充电期间的高极化归因于加剧的不可逆转的局部电场.
间歇性的反向电位应用显著缓解了非法拉代电场的积累.
在10C收费率下,SSB实现了~400%的可逆产能增加.

结论:

这项研究为管理SSB快速充电的短暂现象提供了前所未有的见解.
了解和减轻非法拉第电场动态对于提高SSB性能至关重要.
开发的Cryo-TXM技术为先进电池系统的未来研究提供了强大的工具.

关键词:

冷传输X射线显微镜 X射线显微镜快速充电可以充电.间歇性的反向潜力间歇性的反向潜力固态电池固态电池是什么

更多相关视频

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

Characterization of Electrode Materials for Lithium Ion and Sodium Ion Batteries Using Synchrotron Radiation Techniques

Characterization of Electrode Materials for Lithium Ion and Sodium Ion Batteries Using Synchrotron Radiation Techniques

Published on: November 11, 2013

相关概念视频

Cryo-electron Microscopy

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...

Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...