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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jun 5, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

提高了超声波原子力显微镜中的地下成像,并优化了接触力.

Mingyu Duan¹, Chengjian Wu¹, Jinyan Tang¹

¹The State Key Lab of Fluid Power and Mechatronic Systems, Zhejiang University, Hangzhou 310058, PR China.

Ultramicroscopy

|December 14, 2024

概括

在超声波原子力显微镜 (UAFM) 中优化接触力可以提高地下成像. 一个新的模型改善了对比度,分辨率和深度,用于材料缺陷检查和细胞分析.

关键词:

最佳力预测的最佳力预测.在地表下进行成像.超声波原子力显微镜.

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相关实验视频

Last Updated: Jun 5, 2025

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科学领域:

材料科学材料科学材料科学
纳米技术纳米技术
显微镜的使用方法

背景情况:

超声波原子力显微镜 (UAFM) 对材料和生物样本的非破坏性地下成像至关重要.
在UAFM中图像对比度严重依赖于探针-样本接触力,影响应力场传播.
优化接触力是提高地下成像分辨率和可检测深度的关键.

研究的目的:

提出一个模型来确定UAFM的最佳接触力.
为了提高地下成像对比度,分辨率和可检测深度.
为了提高UAFM在广泛的材料Young的模块 (几十到几百个GPa) 的性能.

主要方法:

在UAFM中开发最佳接触力预测模型.
对模型对图像质量影响的实验验证.
分析成像参数,包括对比度,分辨率和深度.

主要成果:

拟议的模型显著提高了UAFM成像质量.
达到可检测的地下深度超过337.7nm.
实现了在56.9nm以下的横向分辨率,超过了任意力实验.

结论:

开发的模型为优化UAFM地下成像提供了一条途径.
证明了增强的对比度,更高的分辨率和更大的可检测深度.
这项工作提升了地下成像技术的能力.