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Updated: Jun 5, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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螺旋式太赫兹超表面发射以扫描近场纳米显微镜为特征

Mingcong Dai1, Jiahua Cai1, Zejun Ren1

  • 1School of Electronic and Information Engineering, Beihang University, Beijing, China.

Nanophotonics (Berlin, Germany)
|December 16, 2024
PubMed
概括

研究人员开发了一种新的纳米镜技术,以观察太赫兹 (THz) 旋转纳米设备中的超快自旋动力学. 这种方法实现了60nm的分辨率,克服了高级光电子应用的THz波长限制.

关键词:
metasurface 地表的表面是什么扫描近场纳米显微镜进行扫描.旋转电子的THz排放量

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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