在氨热 Mn-补偿 GaN 半导体中的光激发载体动力学
Patrik Ščajev1, Paweł Prystawko2, Robert Kucharski2
1Institute of Photonics and Nanotechnology, Faculty of Physics, Vilnius University, Saulėtekio Ave. 3, 10257 Vilnius, Lithuania.
Materials (Basel, Switzerland)
|December 17, 2024
概括
研究补偿化 (GaN:Mn) 中的载体动力学揭示了缺陷如何影响电荷载体放松. 了解这些动态对于先进的电子设备应用至关重要.
科学领域:
- 半导体物理 半导体物理
- 材料科学 材料科学 材料科学
- 光电学是指光电子产品.
背景情况:
- 氨热化 (GaN:Mn) 是一个有前途的半导体材料.
- 了解载体动态和缺陷影响对于设备性能至关重要.
研究的目的:
- 通过光刺激来研究氨热GaN:Mn中的载体动力学.
- 为了确定Mn诱导状态和Mg受体对电荷载体放松率的影响.
主要方法:
- 用子带间隙和超带间隙光刺激进行光发光分析.
- 探测器测量时间解析载体动态.
- 无接触探测技术用于缺陷分析.
主要成果:
- 杂质的光导和吸收范围在700-800nm左右.
- 导电带尾中的电子驱动光导和黄色发光衰变.
- 受体主导较慢的红色发光和探头衰变.
- 由于缺陷和,黄色光发光衰变时间随着激发强度的增加而增加.
结论:
- 在GaN:Mn中载体放松受到Mn状态和Mg受体的影响.
- 快速的光载体衰变对于高频和高压设备应用至关重要.
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