在现场测试电磁辐射发射特征的关键技术的概述
Zhonghao Lu1, Yan Chen1, Yunxiao Xue1
1College of Electronic Science and Technology, National University of Defense Technology, Changsha 410073, China.
Sensors (Basel, Switzerland)
|December 17, 2024
概括
由于众多电子设备,大型系统面临着电磁兼容性挑战. 本综述分析了电磁干扰 (EMI) 抑制和信号提取的场测量技术,并讨论了未来的趋势.
科学领域:
- 电磁学和信号处理
- 系统工程和兼容性兼容性
背景情况:
- 电子设备密度的增加加剧了大规模系统中的电磁干扰 (EMI) 挑战.
- 传统的实验室环境往往不足以测试庞大的平台的电磁兼容性 (EMC).
- 现场测量技术对于在现实世界的大型环境中评估EMC至关重要.
研究的目的:
- 审查电磁兼容性 (EMC) 现场测量技术的最新情况.
- 分析EMI过和宽带,大动态和快速短暂信号提取的关键技术.
- 总结和分析关于EMI抑制,短暂/宽带测量和环境干扰抑制的研究.
主要方法:
- 对EMC最先进的现场测量技术的文献综述.
- 对EMI过和短暂信号提取技术的分析.
- 对EMI抑制,宽带测量和时间域快速测量技术的比较分析.
主要成果:
- 确定了EMI过和信号提取的关键技术,用于现场测量.
- 总结了EMI抑制和短暂/宽带测量的研究现状.
- 提供了各种现场测量技术的比较分析.
结论:
- 现场测量技术对于应对大型系统中的EMC挑战至关重要.
- 未来的发展趋势指向综合方法,将EMI抑制与先进的测量能力相结合.
- 需要进一步的研究来优化这些技术用于复杂的电磁环境.
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