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对X射线相位对比成像的斑点跟踪算法的审查和实验比较

Rafael Celestre¹, Laurène Quénot², Christopher Ninham²

¹Synchrotron SOLEIL, L'Orme des Merisiers, Dèpartementale 128, Saint-Aubin, France.

Journal of synchrotron radiation

|December 17, 2024

概括

本综述统一了用于相位检索的X射线斑点跟踪方法. 我们比较使用各种样本的算法来评估性能和改善图像质量.

科学领域:

物理物理学物理
光学是什么?光学是什么?光学是什么?
材料科学材料科学材料科学

背景情况:

X射线斑点被用于各种应用,如成像,断层扫描和光学扫描.
从X射线斑点中获取相位信息对于高级应用至关重要.

研究的目的:

审查和实验性比较X射线近场斑点粒跟踪方法.
为了统一概念和术语跨不同的斑点跟踪算法.
为广大受众提供教学和可访问的指南.

主要方法:

专注于X射线近场斑点颗粒作为波浪线标记.
阶段信息检索的数值方法.
常见的跟踪算法及其规格的比较.
使用幻象和复杂样本进行实验验证.

主要成果:

在不同的实验条件下对各种斑点跟踪算法的性能进行比较.
对不同样本类型的图像质量评估和定量分析.
展示了对斑点跟踪方法的一致的术语和形式主义.

结论:

在各种X射线实验中,X射线斑点跟踪为相检索提供了一个强大的方法.
标准化的方法和一致的术语提高了斑点跟踪的可访问性和应用.
这项工作为进一步推进X射线成像和分析提供了基础.

关键词:

在X射线相位对比的X射线相位对比.斑点跟踪跟踪斑点跟踪

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