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Updated: Jun 4, 2025

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces
09:33

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

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纳米交错位移计量使用衍射板拉特纳姆-贝里和绕行阶段元表面

Nick Feldman1,2, Kian M M Goeloe1, Arie J den Boef2,3,4

  • 1Department of Information in Matter and Center for Nanophotonics, AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands.

ACS photonics
|December 23, 2024
PubMed
概括

这项研究引入了一种新的纳米级移位传感平台,使用衍射超表面和极度里埃显微镜. 它实现了对纳米位移的高精度测量,这对于半导体制造至关重要.

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

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Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms08:48

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Published on: September 25, 2020

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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