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Updated: Jun 4, 2025

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

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亚纳米级表面拓对接触线形状的影响:从连贯扫描干涉度计的见解

Yuta Heima1, Hideaki Teshima1,2, Xuehua Zhang3

  • 1Department of Aeronautics and Astronautics, Kyushu University, Motooka 744, Nishi-Ku, Fukuoka 819-0395, Japan.

Langmuir : the ACS journal of surfaces and colloids
|December 24, 2024
PubMed
概括

亚纳米级表面粗性显著变形接触线,特别是在水友表面. 这项研究揭示了纳米级地形如何影响液体行为和固定力,为表面相互作用提供了新的见解.

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Quantitative Hardness Measurement by Instrumented AFM-indentation

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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