相关实验视频

Updated: Jun 3, 2025

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
07:24

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry

Published on: May 6, 2019

8.2K

在ToF-SIMS平行成像MS/MS的肥嵌入涂料的截面

Kimberly G Garcia1, Philippe Massonnet1, Sebastiaan Van Nuffel1

  • 1Maastricht MultiModal Molecular Imaging (M4i) Institute, Maastricht University, Universiteitssingel 50, Maastricht 6229 ER, The Netherlands.

Analytical chemistry
|January 6, 2025
PubMed
概括

飞行时间二次离子质谱 (ToF-SIMS) 与并行MS成像精确识别老油画中的肥. 这一突破有助于理解文化遗产退化和材料分析.

更多相关视频

In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS09:56

In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS

Published on: August 18, 2017

8.9K
3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

1.7K

相关概念视频

Tandem Mass Spectrometry01:21

Tandem Mass Spectrometry

Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and signal-to-noise ratio for the analyte. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.
Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called collision-induced...
889