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Feifan Xu1,2,3, Yinye Ding2, Wenhao Chen3
1Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei 230009, China.
这项研究介绍了一种先进的Moiré边缘阶段提取算法,用于纳米印记 lithography 晶圆-面具对齐. 新方法提高了对齐精度到纳米级,超过现有技术.
09:45Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
06:21Design and Development of a Three-Dimensionally Printed Microscope Mask Alignment Adapter for the Fabrication of Multilayer Microfluidic Devices
Published on: January 25, 2021
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