,Moiré-

Feifan Xu1,2,3, Yinye Ding2, Wenhao Chen3

  • 1Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei 230009, China.

Micromachines
|January 8, 2025
PubMed
概括

这项研究介绍了一种先进的Moiré边缘阶段提取算法,用于纳米印记 lithography 晶圆-面具对齐. 新方法提高了对齐精度到纳米级,超过现有技术.