基于K空间频谱的精密加工表面的几何分布误差建模的错误分离方法
Zhichao Sheng1, Jian Xiong1,2, Zhijing Zhang1
1School of Mechanical Engineering, Beijing Institute of Technology, Beijing 100081, China.
Sensors (Basel, Switzerland)
|January 8, 2025
概括
本研究引入了一种K空间频谱方法,以分离精密加工中的系统和随机几何错误. 该技术有效地隔离错误,保留关键的处理特征以提高准确性.
科学领域:
- 计量学和精密工程 精密工程
- 表面计量学 表面计量学
- 信号处理 信号处理
背景情况:
- 组件表面的几何错误极大地影响了组件的准确性和精密仪器的稳定性.
- 这些错误的准确建模对于性能预测和流程优化至关重要.
- 现有的方法难以有效地分离系统和随机错误组件.
研究的目的:
- 提出一种用于精密加工表面的几何分布误差的新型误差分离方法.
- 使用K空间光谱分析,准确区分系统和随机错误.
- 为了验证该方法在保护表面加工特征方面的有效性.
主要方法:
- 基于K空间频谱的错误分离方法的开发.
- 在K空间光谱中利用十字形边界线方法来定义误差边界.
- 基于频率差异的系统和随机错误的分离.
主要成果:
- 提出的K空间频谱方法成功地分离了系统和随机的几何错误.
- 在加工表面的实验验证证了该方法的有效性.
- 与常见的过技术相比,该方法在随机错误分离方面表现优异.
结论:
- 基于K空间频谱的误差分离方法为分析精密加工中的几何误差提供了强大的方法.
- 这种技术提高了错误建模的准确性,有助于更好的性能预测和流程优化.
- 该方法有效地保留了基本的处理特征,同时分离了随机错误.
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