Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.3K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.3K

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

Intracranial Hypotension After Surgery for Idiopathic Scoliosis Managed Conservatively: A Case Report and Literature Review.

Cureus·2026
Same author

Force-based reading and writing of individual single-atom magnets.

Nature communications·2026
Same author

A case report of atypical hemolytic uremic syndrome with a CFH mutation complicated by recurrent posterior reversible encephalopathy syndrome.

Medicine·2026
Same author

Structural insights into spectral tuning and retinal exchange in cone visual pigments.

Science (New York, N.Y.)·2026
Same author

The role of sulfur vacancies on FeS<sub>2</sub>(100) in NO dissociative adsorption: a combined <i>in situ</i> SR-XPS and DFT calculation study.

Physical chemistry chemical physics : PCCP·2026
Same author

Corrigendum to "Peroxisome proliferator-activated receptor gamma (PPARγ)-targeted Gel/Mg/Lip@Gigantol nanoplatform attenuates skin barrier disruption-associated aging in mice via NLRP3 suppression" [2025Sep5;328(Pt1):147464.doi:10.1016/j.ijbiomac.2025.147464].

International journal of biological macromolecules·2026

相关实验视频

Updated: Jun 3, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

9.6K

在钻石 (001) 表面上进行原子观测,使用近接触原子力显微镜.

Runnan Zhang1, Yuuki Yasui1, Masahiro Fukuda2

  • 1Department of Advanced Materials Science, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan.

Nano letters
|January 8, 2025
PubMed
概括

研究人员使用新的原子力显微镜技术实现了钻石表面的原子层成像. 这一突破克服了以前的挑战,使得钻石生长和缺陷的详细研究能够用于先进的应用.

关键词:
原子力显微镜 原子力显微镜密度函数理论密度函数理论钻石表面 钻石表面点缺陷是指点缺陷的缺陷.表面重建的重建.

更多相关视频

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

2.9K
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

16.6K

相关实验视频

Last Updated: Jun 3, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

9.6K
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

2.9K
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

16.6K

科学领域:

  • 材料科学 材料科学 材料科学
  • 表面科学是一门学科.
  • 纳米技术 纳米技术

背景情况:

  • 钻石 (001) 表面的原子级特征对于理解钻石的生长,缺陷和吸附物至关重要.
  • 之前的尝试面临着挑战,因为钻石的导电性低,C-C键短,阻碍了原子分辨率成像.

研究的目的:

  • 在室温下实现钻石 (001) 表面的原子分辨率成像.
  • 研究使钻石表面的原子分辨率成像成为可能的机制.

主要方法:

  • 接近接触原子力显微镜 (AFM) 使用反应性 (Si) 尖端.
  • 密度功能理论 (DFT) 计算以建模尖端-表面相互作用.

主要成果:

  • 在室温下成功实现了钻石 (001) 表面的原子分辨率成像.
  • 确定了倾斜的Si-C键的形成和表面C-C二极体的重新排序是原子分辨率的关键因素.
  • 证明了克服钻石低导电性和短C-C键所带来的挑战的能力.

结论:

  • 开发的AFM技术为钻石表面提供了前所未有的原子级洞察力.
  • 这一进步对于未来的钻石技术至关重要,包括补充剂识别和纳米结构制造.
  • 允许对钻石应用相关的表面现象进行详细研究.