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Updated: Jun 3, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation
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在钻石 (001) 表面上进行原子观测,使用近接触原子力显微镜

Runnan Zhang1, Yuuki Yasui1, Masahiro Fukuda2

  • 1Department of Advanced Materials Science, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan.

Nano letters
|January 8, 2025
PubMed
概括

研究人员使用新的原子力显微镜技术实现了钻石表面的原子层成像. 这一突破克服了以前的挑战,使得钻石生长和缺陷的详细研究能够用于先进的应用.

关键词:
原子力显微镜 原子力显微镜密度函数理论密度函数理论钻石表面 钻石表面点缺陷是指点缺陷的缺陷.表面重建的重建.

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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