微提取 - - 单颗粒子 - - 感应合等离子体质谱仪用于表面纳米粒子的直接分析
Jordan S Stanberry1, Hunter B Andrews2, Cyril V Thompson1
1Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830, United States.
Analytical chemistry
|January 10, 2025
概括
一个新的微提取探针与单颗粒子诱导合的等离子体质谱学 (ME-SP-ICP-MS) 相结合,允许从表面直接分析纳米粒子. 一个新的PEEK探头显著提高了纳米粒子表征的提取效率.
科学领域:
- 分析化学 分析化学
- 材料科学 材料科学 材料科学
- 纳米技术纳米技术
背景情况:
- 单粒子诱导合等离子体质谱 (SP-ICP-MS) 对于纳米粒子分析至关重要.
- 纳米颗粒的直接表面采样和分析仍然具有挑战性.
研究的目的:
- 开发和优化微提取 (ME) 探头,用于从表面上直接分析纳米粒子的SP-ICP-MS.
- 为了比较一种新型聚乙烯 (PEEK) 探头与商用探头的性能.
主要方法:
- 从表面直接取样纳米粒子的微提取探针的开发.
- 研究影响ME-SP-ICP-MS性能的参数:流量,载体溶液,颗粒大小和探头设计.
- 商用探头与新设计的SP PEEK探头之间的提取效率 (EE) 的比较.
主要成果:
- 优化的ME-SP-ICP-MS技术证明了4-10%的提取效率.
- 与商用探头 (3.9 ± 3%) 相比,新型SP PEEK探头实现了更高的EE (8.5 ± 3%).
- 获得了精确的金纳米颗粒 (30-51 nm) 和铁基微粒 (1000 nm) 的尺寸.
结论:
- ME-SP-ICP-MS提供了一种有前途的方法,用于在各种收集表面上对纳米粒子进行直接的空间分辨率分析.
- 开发的SP PEEK探头提高了纳米粒子提取效率.
- 这种技术促进了直接的粒子分析,保留了空间分布信息.
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