相关实验视频

Updated: Jun 1, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K

通过电子反射散射衍射和共聚焦拉曼光谱学进行二维应变映射

Andrew J Gayle1, Lawrence H Friedman1, Ryan Beams1

  • 1Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

Journal of applied physics
|January 20, 2025
PubMed
概括

研究人员使用电子反射散射衍射 (EBSD) 和拉曼光谱学绘制了中的应变场. 这些技术准确地评估了多轴应变状态,提高了微电机系统 (MEMS) 的可靠性.

更多相关视频

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

12.2K
Production of a Strain-Measuring Device with an Improved 3D Printer06:17

Production of a Strain-Measuring Device with an Improved 3D Printer

Published on: January 30, 2020

6.1K

相关概念视频

Three-Dimensional Analysis of Strain01:29

Three-Dimensional Analysis of Strain

Three-dimensional strain analysis is crucial for understanding how materials deform under stress, particularly in elastic, homogeneous materials. This method employs principal stress axes to simplify complex stress states into more understandable forms. Subjected to stress, a small cubic element within a material either expands or contracts along these axes, transforming into a rectangular parallelepiped. This transformation effectively illustrates the material's deformation. The principal...
202
Raman Spectroscopy: Overview01:20

Raman Spectroscopy: Overview

The underlying principle of Raman spectroscopy is based on the interaction between light and matter, specifically molecules' inelastic scattering of photons. When a monochromatic beam of light, typically from a laser source, interacts with a sample, most scattered light has the same frequency as the incident light. This is known as Rayleigh scattering.
However, a small fraction of the scattered light exhibits a frequency shift due to the exchange of energy between the incident photons and...
301
Measurements of Strain01:27

Measurements of Strain

Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...
371