采用TOF-SIMS对长-5月球土壤矿物质表面的微形态和组成分布的描述

Tinglu Song1, Jie Liu1, Chunlin Zhang2

  • 1Experimental Center of Advanced Materials, School of Materials Science & Engineering, Beijing Institute of Technology, Beijing, 100081, China.

概括

高分辨率的飞行时间二次离子质谱 (TOF-SIMS) 分析了长.