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Updated: May 2, 2026

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
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一个新的多方向剪切干扰测量系统,具有同步极化转移相位的多方向剪切干扰测量系统.

Yahui Zhu1, Ailing Tian2, Hongjun Wang2

  • 1School of Computer Science and Technology, Huaiyin Normal University, Huaian, 223300, Jiangsu, China. zyhxhu@163.com.

Scientific reports
|January 22, 2025
PubMed
概括

一个新的干扰仪使用多方向剪切和偏振相位移来准确测量波浪. 这种先进的光学测试方法克服了干扰测量中常见的非线性和环境挑战.

关键词:
晶体的侧切削是指晶体的侧切削.多向剪切干扰测量多向剪切干扰测量同步偏振相位移同步偏振

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Phase Contrast and Differential Interference Contrast Microscopy01:26

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Phase-Contrast Microscopes
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