NBTVDMOS

Snežana Djorić-Veljković1, Emilija Živanović2, Vojkan Davidović2

  • 1Faculty of Civil Engineering and Architecture, University of Niš, Aleksandra Medvedeva 14, 18104 Niš, Serbia.

Micromachines
|January 25, 2025
PubMed
概括

本研究研究了负偏差温度 (NBT) 应力和辐射如何影响VDMOS晶体管,揭示了复杂的降解和恢复机制,影响设备寿命和性能,特别是在脉冲操作下.

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