商用1.7kV SiC MOSFETs在变化电压下的短路性能分析
Shahid Makhdoom1, Na Ren1,2, Ce Wang1
1College of Electrical Engineering, Zhejiang University, Hangzhou 310027, China.
Micromachines
|January 25, 2025
概括
与1.2kV设备相比,1.7kV碳化物 (SiC) MOSFET显示出优越的短路强度. 这些高压SiC MOSFET超出了行业标准,为下一代电力系统提供了更高的可靠性.
科学领域:
- 电力电子 电力电子 电力电子
- 半导体设备 半导体设备
- 材料科学 材料科学 材料科学
背景情况:
- 碳化物 (SiC) 金属氧化物半导体场效应晶体管 (MOSFET) 对于高功率应用至关重要.
- 在实际条件下,1.2 kV SiC MOSFET 往往无法满足行业标准的短路承受时间 (SCWT).
- 关于高压SiC MOSFET的短路性能存在有限的数据.
研究的目的:
- 为了全面评估商业上可用的1.7kV SiC MOSFETs的短路性能.
- 分析不同电压条件对SCWT的影响.
- 在1.7kV的SiC MOSFET中识别短路事件期间的主导失效机制.
主要方法:
- 在各种排水源电压 (VDS) 条件下对1.7kV的SiC MOSFET进行实验评估.
- 测量短路承受时间 (SCWT).
- 故障分析以确定故障机制.
主要成果:
- 在SCWT和VDS之间存在一个权衡;SCWT从400V的32μs下降到1100V的4μs.
- 在600V (代表实际使用) 时,SCWT为12μs,超过了10μs的行业基准.
- 门介电断裂是VDS≤600V的主要故障模式;热失控发生在更高电压 (800V和1100V) 时.
结论:
- 1.7 kV SiC MOSFET 提供了比 1.2 kV 设备更好的短路稳定性.
- 坚固的门驱动设计和有效的热管理对于可靠的操作至关重要.
- 1.7 kV SiC MOSFET是下一代电力系统中高压应用的可行和高效的解决方案.
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