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扫描热显微镜方法用于非线性设备的自我加热,并应用于丝状电阻随机访问存储器

Nele Harnack¹, Sophie Rodehutskors¹, Bernd Gotsmann¹

¹IBM Research Europe - Zurich, 8803 Rüschlikon, Switzerland.

|January 29, 2025

概括

一种新的扫描热显微镜 (SThM) 方法测量了用于神经形态计算的非线性设备中的自我加热. 这种技术量化了热性能,而无需对材料进行特定校准,从而推进了设备的表征.

科学领域:

材料科学材料科学材料科学
纳米技术纳米技术
计算神经科学是一种神经科学.

背景情况:

神经形态计算依赖于具有非线性电阻电压特征的设备,通常由温度依赖的过程 (如离子迁移) 驱动.
扫描热显微镜 (SThM) 是用于热性质分析的高分辨率技术,但其定量应用受到设备非线性阻碍.
由于自我加热效应和接触变化,现有的SThM方法难以准确测量非线性设备的热量.

研究的目的:

为使用SThM的非线性设备进行定量温度测量开发扩展的非平衡方案.
为了研究基于HfO2的电阻随机访问存储器 (RRAM) 设备中的自我加热现象.
为了使非线性电子元件的材料独立的热特性.

主要方法:

对SThM应用了一种使用DC和AC电压调制的扩展不平衡方案.
同时计算尖端样本的热阻和设备温度升高.
该方法应用于基于HfO2的RRAM设备,以研究光纤切换动态.

主要成果:

拟议的SThM方案成功测量了非线性HfO2基于RRAM设备的自我加热,没有接触校准.
温度成像和热波传播被可视化,揭示了对丝状切换的洞察力.
提取了关键的热特性,如丝数量,热限制和交叉声.

结论:

开发的SThM方法提供了一个强大的,独立于材料的方法来表征非线性设备的热特性.
这种技术对于理解和优化用于神经形态计算应用程序的设备至关重要.
这项研究证明了RRAM设备中的热动态图像和提取关键参数的能力.

关键词:

没有校准的校准.纳米级温度测量方法没有平衡的平衡.这是一个定量性的定量.具有电阻性的RAM.扫描热显微镜扫描热显微镜自己加热的自加热器

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