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Updated: Jul 30, 2026

Implementation of a Reference Interferometer for Nanodetection
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基于激光热结合微干扰成像技术的激光热,对化光学中的吸收缺陷进行高效和敏感的检测

Lin Yao, Han Gu, Chengcheng Wang

    Optics letters
    |January 31, 2025
    PubMed
    概括

    一种新的激光热与微干扰成像 (LTP-MII) 方法相结合,可以有效地检测化光学中的吸收缺陷. 这种敏感的技术甚至显示了ppm级吸收,这对于光学元件质量控制至关重要.

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