Feng Zhu1,2,3, Wanpeng Li1,2,3,4, Man Chun Yeung1,2

  • 1TRACE EM Unit and Department of Materials Science and Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong SAR, People's Republic of China.

概括

本研究介绍了一种方法来测量电脉冲激发的电波传输电子显微镜 (TEM) 中的高频电压衰减. 负电压激发显示出更高的衰减,这对于理解材料动态至关重要.