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使用静态面积探测器进行薄膜X射线衍射的牧场发生率强度校正

Fabian Gasser¹, Josef Simbrunner², Marten Huck^3,4,5

¹Institute of Solid State Physics Graz University of Technology Petersgasse 16 8010Graz Austria.

Journal of applied crystallography

|February 7, 2025

概括

精确的强度校正对于分析薄膜的牧场发射率X射线衍射 (GIXD) 数据至关重要. 本研究提供了系统的校正编译,以改进晶体和纹理分析.

科学领域:

材料科学材料科学材料科学
晶体学晶体学是指结晶学.
表面科学是一门学科.

背景情况:

牧场发生X射线衍射 (GIXD) 对于薄膜分析至关重要.
精确的峰值强度提取对于确定原子位置至关重要.
现有的GIXD数据分析缺乏全面的校正因子编制.

研究的目的:

系统地编译和推导GIXD强度校正的分析公式.
提供适用于具有静态区域探测器的现代GIXD设置的校正.
为了提高从薄膜GIXD数据的晶体和纹理量化的准确性.

主要方法:

对偏振,固角,吸收,传输和洛伦兹校正的分析公式的导出.
从各种样本纹理 (单晶,随机,定向晶体) 的GIXD数据中应用衍生校正.
校正的集成峰值强度与文献单晶衍射数据的比较.

主要成果:

下面是对GIXD进行必要的强度校正的系统汇编.
获得的配方成功地应用于各种薄膜样本.
准确的强度校正被证明可以产生可靠的峰值强度.

结论:

开发的强度校正框架提高了薄膜晶体结构溶液的质量.
通过这些校正,可以从GIXD测量中准确量化相位和纹理.
这项工作为研究人员利用GIXD进行薄膜表征提供了宝贵的资源.

关键词:

在 GIXD 里面.结晶结构溶液的结晶结构是什么牧场发生率X射线衍射射线强度纠正强度纠正薄膜是一种薄膜.

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