使X线

Leonhard M Lohr1, Richard Ciesielski1, Vinh-Binh Truong1

  • 1Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany. leonhard.lohr@ptb.de.

Nanoscale
|February 10, 2025
PubMed
概括

这项研究增强了纳米级半导体测量的散射计. 混合软X射线光分析方法解决了模两可的结果,提高了复杂纳米结构的准确性.

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