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Updated: May 28, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
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从扫描道显微镜中的反错误信号中推导材料属性.

Nileema Sharma1,2, James McKenzie1,2, Matthew Toole1,2

  • 1Department of Physics and Astronomy, University of Notre Dame, Notre Dame, Indiana 46556, United States.

Nano letters
|February 12, 2025
PubMed
概括

扫描道显微镜 (STM) 当前的偏差,通常被忽视,揭示了物理性质. 这项研究表明,这些错误编码了局部屏障高度和差电导率,从而可以进行快速测量.

关键词:
恒定电流模式 恒定电流模式这是一个错误的错误错误.这是一个反循环.干扰是一种干扰.扫描道显微镜扫描道显微镜

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