,使.

Yury N Kulchin1, Arkady A Skvortsov2,3, Vladimir K Nikolaev4

  • 1Institute of Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences, Vladivostok, Russia.

Scientific reports
|February 12, 2025
PubMed
概括

我们开发了一种浮式零算法,以在上稳定热记忆元件,减少读写错误. 这种算法确保了即使在温度变化的情况下也可靠运行,并定义了薄膜设备的安全运行极限.