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Updated: May 27, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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集成的反电子器件用于正子消灭光谱学

Francesco Guatieri1

  • 1Forschungs-Neutronenquelle Heinz Maier-Leibnitz (FRM II) Technische Universität München, Lichtenbergstraße 1, 85748, Garching, Germany. francesco.guatieri@frm2.tum.de.

Scientific reports
|February 18, 2025
PubMed
概括

一个新的微电子设备使雕刻的正子子束能够用于先进的成像. 这项技术提供了高分辨率的正子灭光谱 (PAS) 和正子灭寿命光谱 (PALS) 的速度提高.

关键词:
图像成像是一种成像.微电子学微电子学一个正子子子.

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