使MspADNAG (N 2)

Jiadun Liu1, Luoan Xiong2, Yuhang Hu1

  • 1School of Microelectronics, MOE Engineering Research Center of Integrated Circuits for Next Generation Communications, Southern University of Science and Technology, Shenzhen 518055, China.

PubMed
概括

本研究使用纳米孔实验和模拟来探索双层G-四重复合体. 结果显示了AS1411,AT11和Z-G4的不同事件类型和动态,有助于用于诊断和治疗的aptamer识别.