,

Ekansh Gupta1, Raghupathy Sivakumar2

  • 1Department of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA. ekanshgupta340@gmail.com.

Scientific reports
|February 20, 2025
PubMed
概括

响应合通过将与错误相关的潜能 (ErrPs) 与稳定状态视觉唤起的潜能 (SSVEPs) 配对来提高脑计算机接口 (BCI) 的可靠性. 这种新的方法可以改善非侵入性BCI的信号检测和数据质量.