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Updated: May 26, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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在批量种植的碳化中检查探头光谱的寿命有限的发射器

G L van de Stolpe1,2, L J Feije1,2, S J H Loenen1,2

  • 1QuTech, Delft University of Technology, Delft, The Netherlands.

NPJ quantum information
|February 25, 2025
PubMed
概括

我们开发了一种新的方法来测量固态单光子发射器中的光谱扩散和光学连贯性. 碳化中的单个V2中心显示了狭窄的光学转换和长的连贯时间,非常适合量子网络.

关键词:
电子属性和材料的电子属性和材料.量子信息是一种量子信息.量子计量学的量子计量学

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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