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基于全球灰度统计数据的直线结构光传感器的自适应暴露控制

Yuehua Li¹, Qingfeng Zhao¹, Po Hu²

¹School of Mechanical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China.

Sensors (Basel, Switzerland)

|February 26, 2025

概括

本研究引入了对线结构光传感器的适应性曝光方法,提高了3D测量质量. 新方法提高了对不同物体表面的测量精度和点密度.

科学领域:

光学和光子学在光学和光子学.
计算机视觉计算机视觉
计量学计量学计量学

背景情况:

线结构光传感器对于3D测量至关重要.
一致的条形图像质量对于准确的数据采集至关重要.
对象属性的变化 (形状,材料,颜色) 挑战了测量的一致性.

研究的目的:

为线结构光传感器开发适应性曝光方法.
为了提高跨不同物体特征的测量效率.
为了提高3D测量的质量和准确性.

主要方法:

全球灰度统计分析条纹图像.
基于灰度统计数据的对数和的质量评估参数的计算.
开发一种与质量参数相关的适应性暴露控制系统.
控制系统参数对测量结果的影响分析.

主要成果:

建议的质量评估值显示了与相机曝光时间的近线性相关性.
适应性曝光方法成功地调整相机曝光以适应不同的表面特性.
在有效测量点的数量和整体精度方面都观察到显著的改进.

结论:

适应性曝光方法有效地优化了线结构光传感器的条纹图像采集.
这种技术提高了具有不同光学属性的对象的3D测量性能.
这些发现有助于更强大,更准确的3D扫描应用.

关键词:

适应性暴露控制适应性暴露控制全球灰度统计数据的统计.线性结构的光传感器.条纹图像的质量评估.

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