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Updated: May 25, 2025

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Published on: June 2, 2017

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校正:AFM-IR检查表面敏感模式下在聚烯基基板上的薄PECVDSiO薄膜

Hendrik Müller1, Hartmut Stadler2, Teresa de Los Arcos1

  • 1Technical and Macromolecular Chemistry, Paderborn University, Warburger Str. 100, 33098 Paderborn, Germany.

Beilstein journal of nanotechnology
|February 27, 2025
PubMed
概括

这项研究纠正了之前的文章DOI. 修正后的DOI为10.3762/bjnano.15.51,确保正确的引用和访问研究结果.

关键词:
飞行员空中导航机组IRIR这是XPSXPS.聚烯聚烯的使用方法氧化的氧化是什么?对表面敏感的模式.薄膜是一种薄膜.

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