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相关概念视频

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

1.0K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
1.0K
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

139
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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Updated: May 24, 2025

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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使用能量分散式X射线光谱学量化纳米结构材料中的元素配色.

Kristiaan H Helfferich1, Johannes D Meeldijk2, Marijn A van Huis3

  • 1Materials Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Utrecht, The Netherlands.

Ultramicroscopy
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概括

这项研究引入了一种分析纳米级材料元素分布的新方法,这对于能量和催化是至关重要的. 该技术使用树脂嵌入和先进的显微镜来克服光束损伤,并准确地绘制复杂纳米结构中的元素.

关键词:
双金属催化剂是一种催化剂.定位分析的分析.在EDX光谱学中使用EDX光谱.这就是Pd-Ni.

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In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis
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科学领域:

  • 材料科学 材料科学 材料科学
  • 纳米技术纳米技术
  • 分析化学 分析化学

背景情况:

  • 多元组件纳米结构材料对于能量和催化是至关重要的.
  • 了解纳米级元素分布对于材料性能至关重要.
  • 电子束损伤限制使用传输电子显微镜等技术对光束敏感材料的分析.

研究的目的:

  • 开发一个强大的策略,用于定量评估光束敏感纳米结构样本中的3D元素分布.
  • 克服研究纳米级元素近距离和实现统计学相关评估的局限性.
  • 为在多金属样本中进行元素共定位分析提供实用指南.

主要方法:

  • 用树脂嵌入样品以提高在电子束辐射下稳定性.
  • 将电子断层扫描与能量分散式X射线光谱学相结合,用于元素同定位.
  • 采用一种在3nm- (Pd-Ni) 纳米颗粒上证明的方法,这些纳米颗粒支在半孔上.

主要成果:

  • 获得了足够的样本稳定性,用于以断层扫描为基础的元素分布在纳米和中等尺度的量化.
  • 在复杂的纳米结构中获得可靠的共同定位结果用于元素分析.
  • 证明了树脂嵌入和断层扫描EDX方法对光束敏感材料的有效性.

结论:

  • 提出的战略为对光束敏感纳米结构材料的定量3D元素分布分析提供了强大的解决方案.
  • 开发的方法允许准确评估纳米级元素的近距离,这对于优化材料性能至关重要.
  • 提供了基本重叠分析的实用指南,推进了多金属系统的研究.