Electron Microscope Tomography and Single-particle Reconstruction
Transmission Electron Microscopy
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Updated: May 24, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
这项研究引入了用于分析传输电子显微镜 (TEM) 视频中原子级物体轨迹的新脊检测算法. 该方法有效地随着时间的推移跟踪对象,改进了标准的逐分析.
07:24Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
10:23Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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