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Updated: May 24, 2025

Writing and Low-Temperature Characterization of Oxide Nanostructures
Published on: July 18, 2014
Biswajit Sahoo1,2, Christopher Safranski1, Guohan Hu1
1IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, United States.
这项研究表明,铜层增强了基于NiO的设备中的自旋电流传输,这对于可靠的纳米磁铁内存至关重要. 这为先进的自旋电子应用改进了电荷-自旋分离.
09:20Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Published on: December 7, 2015
08:12Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
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