新型双向ESD电路用于GaN HEMT
Pengfei Zhang1, Cheng Yang1, Jingyu Shen2
1School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China.
Micromachines
|March 6, 2025
概括
这项研究引入了一种新的双向静电放电 (ESD) 紧固件电路,用于p-GaN门HEMTs. 拟议的电路在ESD事件期间有效地紧门源电压,提高设备的可靠性并减少功耗损失.
科学领域:
- 半导体设备物理 半导体设备物理
- 电气工程 电气工程
- 材料科学 材料科学 材料科学
背景情况:
- 高电子移动性晶体管 (HEMT) 对于高功率应用至关重要.
- 确保强大的静电放电 (ESD) 保护对于这些设备的可靠性至关重要.
- 现有的ESD保护电路可能在双向保护或功率效率方面存在局限性.
研究的目的:
- 为p-GaN门HEMT提出和研究一种新的ESD保护电路.
- 为了实现可靠的双向ESD保护,使用紧固件电路.
- 为了提高二次故障电流能力并减少静电损耗.
主要方法:
- 一个ESD电路的设计,包括连续前置二极管和反向二极管.
- 在短暂的ESD脉冲下对拟议的ESD的性能进行实验验证.
- 对放电通道形成和电压紧行为进行分析.
主要成果:
- 拟议的ESD紧固件电路展示了有效的双向ESD保护功能.
- 它成功地将p-GaN HEMT的门到源电压紧到安全水平.
- 该电路在前向和反向的短暂ESD事件中表现出高的二次故障电流.
- 实验验证证了在静态状态下减少的功耗损失.
结论:
- 开发的双向紧电路为p-GaN门HEMT中的ESD保护提供了可行的解决方案.
- 这种方法可以提高设备对ESD事件的稳定性,同时提高功率效率.
- 这些发现有助于推进可靠的高功率半导体设备.
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