YOLOv8-DEE:一种用于印刷电路板缺陷检测的高精度模型
Feifan Yi1,2, Ahmad Sufril Azlan Mohamed1, Mohd Halim Mohd Noor1
1School of Computer Sciences, Universiti Sains Malaysia, Penang, Malaysia.
PeerJ. Computer science
|March 10, 2025
概括
一个新的深度学习模型YOLOv8-DEE显著提高了印刷电路板 (PCB) 缺陷检测的准确性. 这种先进的方法增强了特征提取和本地化,以实现更可靠的消费电子产品生产.
科学领域:
- 计算机视觉 计算机视觉
- 人工智能的人工智能
- 制造业 制造技术 制造技术
背景情况:
- 印刷电路板 (PCB) 的缺陷会影响消费电子产品的质量,稳定性和可靠性.
- 现有的PCB缺陷检查模型由于复杂的背景和多层次缺陷特征而面临准确性限制.
研究的目的:
- 引入一个增强的YOLOv8网络,YOLOv8-DEE,以提高检测印刷电路板 (PCB) 缺陷的准确性.
- 为了应对复杂的背景和PCB缺陷检测中的多尺度特征的挑战.
主要方法:
- 通过在骨干中使用深度可分离卷积 (DSC) 模块来增强YOLOv8-DEE的YOLOv8-L模型,以实现卓越的特征提取.
- 在网络的子中集成了一个高效的多尺度注意力 (EMA) 模块,以改善上下文信息交互.
- 将完整的交叉与工会 (CIoU) 损失取代为高效的交叉与工会 (EIoU) 损失,以更好地定位不同尺寸和尺寸比的缺陷.
主要成果:
- 在HRIPCB数据集上,YOLOv8-DEE的平均精度为97.5%,在DeepPCB数据集上达到98.7%.
- 在各自的数据集上,与基线YOLOv8-L模型相比,表现出2.5%和0.7%的性能改善.
- 在检测小型,中型和大型PCB缺陷方面超过了其他最先进的方法.
结论:
- 拟议的YOLOv8-DEE模型有效地提高了PCB缺陷检测的准确性和可靠性.
- 集成DSC,EMA和EIoU模块有助于在复杂的工业检查场景中提供卓越的性能.
- YOLOv8-DEE代表了电子制造业自动化视觉检查的重大进步.
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