在自闭症谱系障碍中的临床和遗传发现,使用外基因组测序分析
Ana Blázquez1,2,3, Laia Rodriguez-Revenga4,5,6, María I Alvarez-Mora4,5,6
1Department of Child and Adolescent Psychiatry and Psychology, Institute of Neuroscience, Hospital Clínic de Barcelona, Barcelona, Spain.
外基因序列测序在10名自闭症谱系障碍 (ASD) 患者中发现了致病变体,这些患者对染色体微阵列分析呈阴性. 这种基因测试为复杂的神经发育障碍提供了扩展的诊断选择.
科学领域:
- 神经发育障碍 神经发育障碍
- 自闭症谱系障碍 (ASD) 的遗传学
背景情况:
- 自闭症谱系障碍 (ASD) 是一种复杂的神经发育障碍,具有异质的表型.
- 社会互动,沟通和重复行为受损的特征是ASD.
- 染色体微阵列 (CMA) 和脆弱X综合征分析是确定ASD相关基因的既定工具.
研究的目的:
- 调查外体序列测序 (ES) 对ASD患者遗传诊断的有用性.
- 识别有助于ASD病因的新型候选基因.
- 为了将遗传发现与ASD的临床表型相关联.
主要方法:
- 在研究队列中,使用CMA评估了全基因组拷贝数变异.
- 在20名患有自闭症的受试者身上进行了外体序列 (ES) 测序.
- 收集了临床数据,包括同时出现的疾病和异形特征.
主要成果:
- 通过CMA.没有检测到具有临床意义的副本数变异.
- 外体序列测序在20名患者中有10名 (50%) 发现了致病变体.
- 这些基因包括ADNP,FBN1,WAC,ASXL3,NR4A2,ALX4,ANKRD1,POGZ,SHANK3和BPTF. 阳性ES发现的患者更有可能表现出异形特征,低血压和精神运动延迟.
结论:
- 外体序列测序为ASD患者提供了有价值的诊断产量,这些患者的CMA阴性.
- 发现的基因变异有助于理解ASD病因.
- 需要进一步的研究来阐明与ASD相关的各种表型.
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