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聚合物薄膜厚度的实时映射使用近红外高光谱成像

Xiaoyun Chen1, Jin Wang2, Christopher Thurber2

  • 1Analytical Science, 1897 Building, The Dow Chemical Company, Midland, Michigan 48667, USA.

Applied spectroscopy
|March 13, 2025
PubMed
概括

一种新的近红外 (NIR) 超光谱成像 (HSI) 方法可以实时进行二维聚合物薄膜厚度映射. 这种先进的技术提供了优越的基于线的测量与传统的基于点的方法相比.

关键词:
在HSI中,HSI就是HSI.在NIR中,NIR是NIR.接近红外的近红外.超光谱成像技术的使用.绘制地图,绘制地图.聚合物薄膜是一种聚合物薄膜.厚度 厚度 的 厚度.

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