Cryo-electron Microscopy
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Updated: May 22, 2025
A Robust Single-Particle Cryo-Electron Microscopy cryo-EM Processing Workflow with cryoSPARC, RELION, and Scipion
Published on: January 31, 2022
Yifan Cheng1, Junrui Li2, Yifei Chen2+4
1HHMI/University of California San Francisco.+5
单颗粒冷电子显微镜 (cryo-EM) 可能会受到偏好的方向的影响,导致异型分辨率. 一种新的解卷法,AR-Decon,从计算上改善了这些数据集的3D地图质量.
Single Particle Cryo-Electron Microscopy: From Sample to Structure
Published on: May 29, 2021
Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
Published on: March 16, 2022
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