相关实验视频

Updated: May 21, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.6K

在2D材料中的缺陷中检测电荷转移,使用电子图解学

Christoph Hofer1, Jacob Madsen2, Toma Susi2

  • 1EMAT, University of Antwerp, Antwerp, Belgium.

Journal of microscopy
|March 21, 2025
PubMed
概括

我们开发了一种敏感的电子图谱技术,以在单层二硫化物 (WS) 中成像原子规模的电子电荷转移. 这种方法揭示了先前隐藏在主导原子核信号中的结合信息.

关键词:
结合的结合 结合的结合密度函数理论密度函数理论扫描传输电子显微镜扫描传输电子显微镜过渡金属二甲基二甲基化物职位的空缺 职位的空缺

更多相关视频

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.0K
Scanning-probe Single-electron Capacitance Spectroscopy10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.0K

相关概念视频

¹³C NMR: Distortionless Enhancement by Polarization Transfer (DEPT)01:20

¹³C NMR: Distortionless Enhancement by Polarization Transfer (DEPT)

When proton-coupled carbon-13 spectra are simplified by a broadband proton decoupling technique, structural information about the coupled protons is lost. Distortionless enhancement by polarization transfer (DEPT) is a technique that provides information on the number of hydrogens attached to each carbon in a molecule. While the DEPT experiment utilizes complex pulse sequences, the pulse delay and flip angle are specifically manipulated. The resulting signals have different phases depending on...
991