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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

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Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
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相关实验视频

Updated: May 20, 2025

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
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High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

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通过使用深度学习,在高分辨率下加速边缘投影造型测量到100kfps,使用深度学习.

Jie Xu1, Jindong Tian2,3

  • 1College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, China.

Light, science & applications
|March 27, 2025
PubMed
概括

深度学习显著增强了边缘投影特征测量,使得超快的3D成像能够以每秒10万的速度进行. 这一突破允许在高速短暂事件中进行高分辨率测量.

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Lens-free Video Microscopy for the Dynamic and Quantitative Analysis of Adherent Cell Culture
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Lens-free Video Microscopy for the Dynamic and Quantitative Analysis of Adherent Cell Culture

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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Lens-free Video Microscopy for the Dynamic and Quantitative Analysis of Adherent Cell Culture
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科学领域:

  • 光学和光子学 在光学和光子学.
  • 计算机视觉 计算机视觉
  • 计量学 计量学 计量学

背景情况:

  • 边缘投影造型测量是一种关键的3D成像技术.
  • 传统方法在动态场景的速度和分辨率方面面临限制.

研究的目的:

  • 调查深度学习对边缘投影特征测量的影响.
  • 为了实现高速,高分辨率的3D测量.

主要方法:

  • 深度学习算法的应用到边缘投影数据.
  • 开发一个能够采集高率3D数据的系统.

主要成果:

  • 实现的成像速度高达每秒10万.
  • 保持了高分辨率的3D测量功能.
  • 证明了超快3D测量的可行性.

结论:

  • 深度学习在高速应用中彻底改变了边缘投影特征测量.
  • 在捕捉短暂的3D现象方面提供了新的可能性.
  • 推动了超快速计量学领域的发展.