带有集成MOS通道二极管的SiC双槽MOSFET可提高第三象限性能
Zhiyu Wang1, Hongshen Wang1, Yuanjie Zhou1
1School of Microelectronics and Communication Engineering, Chongqing University, Chongqing 400030, China.
Micromachines
|March 27, 2025
概括
这项研究引入了一种具有集成MOS通道二极管 (MCD) 的新型碳化 (SiC) MOSFET. 该设备的设计减少了寄生虫二极管.
科学领域:
- 半导体设备物理学 半导体设备物理
- 动力电子产品的动力电子.
- 材料科学是一种材料科学.
背景情况:
- 碳化 (SiC) MOSFET对于高功率应用至关重要.
- 在SiC MOSFETs中的寄生性双极降解限制了性能.
- 降低电阻和门电压对于效率至关重要.
研究的目的:
- 提出和分析一款具有集成MOS通道二极管 (MCD) 的新型双槽SiC MOSFET.
- 调查MCD集成对设备性能的影响,包括故障电压和电阻.
- 为了减轻双极退化,并改善寄生虫二极管的切入电压.
主要方法:
- 技术计算机辅助设计 (TCAD) 模拟用于设备分析.
- 该设计在MCD中采用了一个短通道,可通过槽深度进行调节.
- 分析的重点是排水诱导的降低屏障 (DIBL) 效应及其对设备特征的影响.
主要成果:
- 集成的MCD有效地消除了寄生虫p-i-n二极管的双极退化.
- 在切断电压 (Von) 中实现了69.2%的显著降低.
- 由于减轻了JFET效应,特定的电阻 (Ron,sp) 和值电压 (Vth) 降低了.
- 断裂电压 (BV) 在很大程度上保持不变.
- 门电荷 (Qg) 略有增加,导致开关损失略有增加.
结论:
- 新型双槽SiC MOSFET与MCD通过降低切入电压和电阻来提高性能.
- 该设计成功克服了寄生性双极退化问题.
- 虽然开关损失略有增加,但整体好处表明了先进电力电子应用的潜力.
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