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Xinfang Zhao1, Qinghua Lyu1, Hui Zeng1
1National "111 Research Center" Microelectronics and Integrated Circuits, School of Science, Hubei University of Technology, Wuhan 430068, China.
本研究介绍了一种优化的GLV-YOLO模型,用于实时光电探测器表面缺陷检测. 改进的算法实现了高精度,降低了复杂性,改善了制造质量控制.
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