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Hexiang Guo1, Junya Wang1, Zheng You1
1School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
这项研究引入了一个新的基准平台,用于准确测量微电机系统 (MEMS) 扫描镜的性能. 开发的系统精确量化了偏斜角度,共振频率和角分辨率,用于先进的应用.
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10:28Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
11:27Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
Published on: December 8, 2016