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Updated: Jun 30, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
09:48

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

通过以原子力显微镜为基础的红外与纳米尺度横向分辨率的超分子自组合单层的化学映射

Alexandre Dazzi1, Frank Palmino2, Ariane Deniset-Besseau1

  • 1Université Paris-Saclay, Institut de Chimie-Physique, F-91400 Orsay, France.

The journal of physical chemistry letters
|March 27, 2025
PubMed
概括

原子力显微镜-红外光谱 (AFM-IR) 现在可以实现单纳米化学成像. 这一突破使复杂材料的亚分子映射成为可能,推动了纳米科学研究.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...