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Updated: May 16, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

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实时反质子消灭顶点与亚微米分辨率

Michael Berghold1, Davide Orsucci2, Francesco Guatieri1,3,4

  • 1Research Neutron Source Heinz Maier-Leibnitz (FRM II), Technical University of Munich, Lichtenbergstr. 1 Garching bei München, 85748 Bayern Germany.

Science advances
|April 2, 2025
PubMed
概括

该AEḡIS实验旨在使用一种新的顶点探测器测量抗自由落体. 这项新技术在确定灭绝事件方面取得了前所未有的准确性,推进了反引力研究.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
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