超低交叉点的开关由热和电驱动
Peng Bao1, Chunhui Yao1,2, Chenxi Tan1
1Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, UK.
Microsystems & nanoengineering
|April 3, 2025
概括
研究人员使用马赫-泽恩德干扰仪 (MZI) 设计开发了新的光子开关,以实现超低交叉声,这对于高速数据中心至关重要. 这些热光学 (T-O) 和电光学 (E-O) 开关显著提高了光学网络中的信号完整性.
科学领域:
- 光子学和光学工程 光子学和光学工程
- 材料科学与工程 材料科学与工程
- 计算机工程 计算机工程
背景情况:
- 光子开关对于管理数据中心不断增加的数据流量至关重要,因为它们的效率和带宽.
- 大规模光子电路中的交叉声仍然是一个重大挑战,危及信号完整性.
- 现有的马赫-泽恩德干扰仪 (MZI) 开关设计需要进一步优化,以最大限度地减少交叉通话.
研究的目的:
- 介绍新的马赫-泽恩德干扰仪 (MZI) 交换机设计,具有超低交叉声.
- 在设备和电路层面优化开关织物,以抑制交叉通话和降低复杂性.
- 为了证明利用自我加热效应提高MZI开关性能的有效性.
主要方法:
- 开发了两个马赫-泽恩德干扰仪 (MZI) 开关设计:一个热光学 (T-O) 和一个电光学 (E-O).
- 优化了设备和电路层面的开关设计,以最大限度地减少交叉通话.
- 利用基于载体注射的MZI开关中的自加热效应来创建相位变换器,以匹配插入损失.
主要成果:
- 在T-O和E-O开关中实现了低于-40dB的超低交叉声比.
- 证明了芯片上的损失<5dB,T-O开关的切换时间为500μs.
- 显示了8.5dB的芯片损失,E-O开关的切换时间<100n,成功传输了50Gb/s的数据.
结论:
- 拟议的MZI开关设计有效地抑制交叉通话,增强光子电路中的信号完整性.
- 在 E-O MZI 开关中使用自热效应的新方法为实现任意相差和匹配插入损失提供了一个有希望的方法.
- 这些超低交叉声的光子交换机对未来的高容量数据中心网络和光通信系统具有重大潜力.
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